Moreno, Anthony R. and Gomez, Frederick Ray I. and Rodriguez, Rennier S. (2021) Ball Crack Mitigation through Wirebond Process Optimization. Journal of Engineering Research and Reports, 20 (2). pp. 1-5. ISSN 2582-2926
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Abstract
Intermetallic is a critical factor that is controlled and limit during manufacturing of integrated units. Through improving the ball flatness response of the semiconductor wire significantly impact the outcome for the intermetallic characteristic between metal such as Gold-Aluminum connection. The implementation of this study on the actual manufacturing control eliminates escapee of poor intermetallic that would impact the reliability and integrity of the package upon its application to the end product.
Item Type: | Article |
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Subjects: | Digital Open Archives > Engineering |
Depositing User: | Unnamed user with email support@digiopenarchives.com |
Date Deposited: | 30 Jan 2023 10:25 |
Last Modified: | 11 Jul 2024 09:35 |
URI: | http://geographical.openuniversityarchive.com/id/eprint/158 |